COMBINED ELLIPSOMETER SYSTEM WITH OPTICAL PROFILER will be released on MARCH 2013 at APS meeting.

Optosense has been introduced a new OPTICAL PROFILOMETER integrated ellipsometer system.

FEATURES

• Combined OPTICAL PROFILER
• Discrete wavelenght ellipsometry 
• Wavelengths: 532 nm, 635 nm, 785 nm, 1064 nm, or 1310 nm
• Spectroscopic range:  350-850 nm; 250-1100 nm; 250-1700 nm
• Excellent accuracy and repetition
• Widest variable angle (20°-90°) 
• Compensator technology to achieve accurate measurement range of 0-360 degrees full angle measurement without blind spot
• Non-Destructive Testing
• Easy sample alignment
• Measurement speed is less than 1 sec.
• Large Sample Stage 
• User friendly and powerful software and materials library  
• Hundreds of materials information in material library.